Laurence Goodby, Alex Orailoglu
Test Quality and Fault Risk in Digital Filter Datapath BIST
DATE, 2000.
@inproceedings{DATE-2000-GoodbyO, author = "Laurence Goodby and Alex Orailoglu", booktitle = "{Proceedings of the Fifth Conference on Design, Automation and Test in Europe}", doi = "10.1109/DATE.2000.840827", isbn = "0-7695-0537-6", pages = "468--475", publisher = "{IEEE Computer Society}", title = "{Test Quality and Fault Risk in Digital Filter Datapath BIST}", year = 2000, }