Irith Pomeranz, Sudhakar M. Reddy
Functional Test Generation for Full Scan Circuits
DATE, 2000.
@inproceedings{DATE-2000-PomeranzR00a, author = "Irith Pomeranz and Sudhakar M. Reddy", booktitle = "{Proceedings of the Fifth Conference on Design, Automation and Test in Europe}", doi = "10.1109/DATE.2000.840302", isbn = "0-7695-0537-6", pages = "396--401", publisher = "{IEEE Computer Society}", title = "{Functional Test Generation for Full Scan Circuits}", year = 2000, }