Functional Test Generation for Full Scan Circuits
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Irith Pomeranz, Sudhakar M. Reddy
Functional Test Generation for Full Scan Circuits
DATE, 2000.

DATE 2000
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@inproceedings{DATE-2000-PomeranzR00a,
	author        = "Irith Pomeranz and Sudhakar M. Reddy",
	booktitle     = "{Proceedings of the Fifth Conference on Design, Automation and Test in Europe}",
	doi           = "10.1109/DATE.2000.840302",
	isbn          = "0-7695-0537-6",
	pages         = "396--401",
	publisher     = "{IEEE Computer Society}",
	title         = "{Functional Test Generation for Full Scan Circuits}",
	year          = 2000,
}

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Bibliography of Software Language Engineering in Generated Hypertext (BibSLEIGH) is created and maintained by Dr. Vadim Zaytsev.
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