Irith Pomeranz, Sudhakar M. Reddy
Functional Test Generation for Full Scan Circuits
DATE, 2000.
@inproceedings{DATE-2000-PomeranzR00a,
author = "Irith Pomeranz and Sudhakar M. Reddy",
booktitle = "{Proceedings of the Fifth Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.2000.840302",
isbn = "0-7695-0537-6",
pages = "396--401",
publisher = "{IEEE Computer Society}",
title = "{Functional Test Generation for Full Scan Circuits}",
year = 2000,
}











