Ismet Bayraktaroglu, Alex Orailoglu
Diagnosis for scan-based BIST: reaching deep into the signatures
DATE, 2001.
@inproceedings{DATE-2001-BayraktarogluO,
author = "Ismet Bayraktaroglu and Alex Orailoglu",
booktitle = "{Proceedings of the Sixth Conference on Design, Automation and Test in Europe}",
doi = "10.1145/367072.367105",
isbn = "0-7695-0993-2",
pages = "102--111",
publisher = "{ACM}",
title = "{Diagnosis for scan-based BIST: reaching deep into the signatures}",
year = 2001,
}