1 × Germany
2 × France
3 × USA
A.Orailoglu W.Rao S.Ozev
scan (4) diagnosi (3) test (3) bist (3) base (3) applic (2) volum (2) fault (2) time (2) superposit (1)
Person: Ismet Bayraktaroglu
Wrote 6 papers:
- Test application time and volume compression through seed overlapping (WR, IB, AO), pp. 732–737.
- DATE-2002-BayraktarogluO #fault
- Gate Level Fault Diagnosis in Scan-Based BIST (IB, AO), pp. 376–381.
- DAC-2001-BayraktarogluO #reduction
- Test Volume and Application Time Reduction Through Scan Chain Concealment (IB, AO), pp. 151–155.
- Diagnosis for scan-based BIST: reaching deep into the signatures (IB, AO), pp. 102–111.
- DAC-2000-BayraktarogluO #fault
- Improved fault diagnosis in scan-based BIST via superposition (IB, AO), pp. 55–58.
- DATE-2000-OzevBO #synthesis
- Test Synthesis for Mixed-Signal SOC Paths (SO, IB, AO), pp. 128–133.