Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet
On the Use of an Oscillation-Based Test Methodology for CMOS Micro-Electro-Mechanical Systems
DATE, 2002.
@inproceedings{DATE-2002-BeroulleBLN,
acmid = "874448",
author = "Vincent Beroulle and Yves Bertrand and Laurent Latorre and Pascal Nouet",
booktitle = "{Proceedings of the Seventh Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.2002.998476",
isbn = "0-7695-1471-5",
pages = "1120",
publisher = "{IEEE Computer Society}",
title = "{On the Use of an Oscillation-Based Test Methodology for CMOS Micro-Electro-Mechanical Systems}",
year = 2002,
}