Travelled to:1 × Germany
2 × France
Collaborated with:Y.Bertrand L.Latorre V.Beroulle A.Toulouse D.Bernard C.Landrault A.A.Rekik F.Azaïs N.Dumas F.Mailly P.Hazard F.Pressecq
Talks about:model (2) test (2) cmos (2) interconnect (1) acceleromet (1) methodolog (1) submicron (1) character (1) extract (1) electro (1)
Person: Pascal Nouet
DBLP: Nouet:Pascal
Contributed to:
201120021999Wrote 4 papers:
- DATE-2011-RekikADMN #development #evaluation
- An electrical test method for MEMS convective accelerometers: Development and evaluation (AAR, FA, ND, FM, PN), pp. 806–811.
- DATE-2002-BeroulleBLN #on the #using
- On the Use of an Oscillation-Based Test Methodology for CMOS Micro-Electro-Mechanical Systems (VB, YB, LL, PN), p. 1120.
- DATE-1999-LatorreBHPN #design #modelling
- Design, Characterization & Modelling of a CMOS Magnetic Field Sensor (LL, YB, PH, FP, PN), pp. 239–243.
- DATE-1999-ToulouseBLN #3d #modelling #performance
- Efficient 3D Modelling for Extraction of Interconnect Capacitances in Deep Submicron Dense Layouts (AT, DB, CL, PN), pp. 576–580.