Anshuman Chandra, Krishnendu Chakrabarty
Test Resource Partitioning and Reduced Pin-Count Testing Based on Test Data Compression
DATE, 2002.
@inproceedings{DATE-2002-ChandraC, acmid = "874387", author = "Anshuman Chandra and Krishnendu Chakrabarty", booktitle = "{Proceedings of the Seventh Conference on Design, Automation and Test in Europe}", doi = "10.1109/DATE.2002.998362", isbn = "0-7695-1471-5", pages = "598--603", publisher = "{IEEE Computer Society}", title = "{Test Resource Partitioning and Reduced Pin-Count Testing Based on Test Data Compression}", year = 2002, }