Travelled to:2 × France
2 × USA
3 × Germany
Collaborated with:K.Chakrabarty R.Kapur Y.Kanzawa F.Ng V.Iyengar S.Schweizer
Talks about:test (11) data (6) scan (5) compress (4) power (4) use (3) system (2) reduct (2) volum (2) code (2)
Person: Anshuman Chandra
DBLP: Chandra:Anshuman
Contributed to:
200920082003
2002200220012001Wrote 7 papers:
- DATE-2009-ChandraKK #adaptation #scalability
- Scalable Adaptive Scan (SAS) (AC, RK, YK), pp. 1476–1481.
- DATE-2008-ChandraNK #architecture #power management #reduction #testing
- Low Power Illinois Scan Architecture for Simultaneous Power and Test Data Volume Reduction (AC, FN, RK), pp. 462–467.
- DATE-2003-IyengarCSC #approach #optimisation #testing #using
- A Unified Approach for SOC Testing Using Test Data Compression and TAM Optimization (VI, AC, SS, KC), pp. 11188–11190.
- DAC-2002-ChandraC #reduction #testing #using
- Reduction of SOC test data volume, scan power and testing time using alternating run-length codes (AC, KC), pp. 673–678.
- DATE-2002-ChandraC #clustering #testing
- Test Resource Partitioning and Reduced Pin-Count Testing Based on Test Data Compression (AC, KC), pp. 598–603.
- DAC-2001-ChandraC #power management #testing
- Combining Low-Power Scan Testing and Test Data Compression for System-on-a-Chip (AC, KC), pp. 166–169.
- DATE-2001-ChandraC #performance #testing #using
- Efficient test data compression and decompression for system-on-a-chip using internal scan chains and Golomb coding (AC, KC), pp. 145–149.