A New ATPG Algorithm to Limit Test Set Size and Achieve Multiple Detections of All Faults
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Sooryong Lee, Brad Cobb, Jennifer Dworak, Michael R. Grimaila, M. Ray Mercer
A New ATPG Algorithm to Limit Test Set Size and Achieve Multiple Detections of All Faults
DATE, 2002.

DATE 2002
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@inproceedings{DATE-2002-LeeCDGM,
	acmid         = "874364",
	author        = "Sooryong Lee and Brad Cobb and Jennifer Dworak and Michael R. Grimaila and M. Ray Mercer",
	booktitle     = "{Proceedings of the Seventh Conference on Design, Automation and Test in Europe}",
	doi           = "10.1109/DATE.2002.998255",
	isbn          = "0-7695-1471-5",
	pages         = "94--99",
	publisher     = "{IEEE Computer Society}",
	title         = "{A New ATPG Algorithm to Limit Test Set Size and Achieve Multiple Detections of All Faults}",
	year          = 2002,
}

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