Travelled to:2 × Germany
2 × USA
3 × France
Collaborated with:M.R.Mercer R.I.Bahar B.Cobb A.Zygmontowicz A.Crouch J.C.Potter N.Alves K.Nepal V.Stojanovic R.Weiss J.Wingfield S.Lee M.R.Grimaila E.Alpaslan B.Kruseman A.K.Majhi W.M.Heuvelman P.v.d.Wiel J.Liou L.Wang K.Cheng R.Kapur T.W.Williams
Talks about:detect (3) test (3) multipl (2) effect (2) fault (2) delay (2) use (2) microprocessor (1) misdirect (1) implement (1)
Person: Jennifer Dworak
DBLP: Dworak:Jennifer
Contributed to:
201420102009
2006200420022002Wrote 7 papers:
- DATE-2014-ZygmontowiczDCP #network
- Making it harder to unlock an LSIB: Honeytraps and misdirection in a P1687 network (AZ, JD, AC, JCP), pp. 1–6.
- DATE-2010-AlpaslanDKMHW #simulation
- NIM- a noise index model to estimate delay discrepancies between silicon and simulation (EA, JD, BK, AKM, WMH, PvdW), pp. 1373–1376.
- DATE-2009-AlvesNDB #detection #fault #multi #using
- Detecting errors using multi-cycle invariance information (NA, KN, JD, RIB), pp. 791–796.
- DAC-2006-StojanovicBDW #effectiveness #implementation #queue
- A cost-effective implementation of an ECC-protected instruction queue for out-of-order microprocessors (VS, RIB, JD, RW), pp. 705–708.
- DATE-v2-2004-DworakCWM #detection #fault
- Balanced Excitation and Its Effect on the Fortuitous Detection of Dynamic Defects (JD, BC, JW, MRM), pp. 1066–1071.
- DAC-2002-LiouWCDMKW #fault #multi #performance #testing #using
- Enhancing test efficiency for delay fault testing using multiple-clocked schemes (JJL, LCW, KTC, JD, MRM, RK, TWW), pp. 371–374.
- DATE-2002-LeeCDGM #algorithm #detection #fault #multi #testing
- A New ATPG Algorithm to Limit Test Set Size and Achieve Multiple Detections of All Faults (SL, BC, JD, MRG, MRM), pp. 94–99.