@inproceedings{DATE-2002-LiHCSWCCHL,
	acmid         = "874547",
	author        = "Jin-Fu Li and Hsin-Jung Huang and Jeng-Bin Chen and Chih-Pin Su and Cheng-Wen Wu and Chuang Cheng and Shao-I Chen and Chi-Yi Hwang and Hsiao-Ping Lin",
	booktitle     = "{Proceedings of the Seventh Conference on Design, Automation and Test in Europe}",
	doi           = "10.1109/DATE.2002.998317",
	isbn          = "0-7695-1471-5",
	pages         = "486--490",
	publisher     = "{IEEE Computer Society}",
	title         = "{A Hierarchical Test Scheme for System-On-Chip Designs}",
	year          = 2002,
}