Amit R. Pandey, Janak H. Patel
An Incremental Algorithm for Test Generation in Illinois Scan Architecture Based Designs
DATE, 2002.
@inproceedings{DATE-2002-PandeyP,
acmid = "874344",
author = "Amit R. Pandey and Janak H. Patel",
booktitle = "{Proceedings of the Seventh Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.2002.998300",
isbn = "0-7695-1471-5",
pages = "368--375",
publisher = "{IEEE Computer Society}",
title = "{An Incremental Algorithm for Test Generation in Illinois Scan Architecture Based Designs}",
year = 2002,
}











