An Incremental Algorithm for Test Generation in Illinois Scan Architecture Based Designs
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Amit R. Pandey, Janak H. Patel
An Incremental Algorithm for Test Generation in Illinois Scan Architecture Based Designs
DATE, 2002.

DATE 2002
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@inproceedings{DATE-2002-PandeyP,
	acmid         = "874344",
	author        = "Amit R. Pandey and Janak H. Patel",
	booktitle     = "{Proceedings of the Seventh Conference on Design, Automation and Test in Europe}",
	doi           = "10.1109/DATE.2002.998300",
	isbn          = "0-7695-1471-5",
	pages         = "368--375",
	publisher     = "{IEEE Computer Society}",
	title         = "{An Incremental Algorithm for Test Generation in Illinois Scan Architecture Based Designs}",
	year          = 2002,
}

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