Amit R. Pandey, Janak H. Patel
An Incremental Algorithm for Test Generation in Illinois Scan Architecture Based Designs
DATE, 2002.
@inproceedings{DATE-2002-PandeyP, acmid = "874344", author = "Amit R. Pandey and Janak H. Patel", booktitle = "{Proceedings of the Seventh Conference on Design, Automation and Test in Europe}", doi = "10.1109/DATE.2002.998300", isbn = "0-7695-1471-5", pages = "368--375", publisher = "{IEEE Computer Society}", title = "{An Incremental Algorithm for Test Generation in Illinois Scan Architecture Based Designs}", year = 2002, }