Satoshi Ohtake, Kouhei Ohtani, Hideo Fujiwara
A Method of Test Generation fo Path Delay Faults Using Stuck-at Fault Test Generation Algorithms
DATE, 2003.
@inproceedings{DATE-2003-OhtakeOF,
acmid = "1022743",
author = "Satoshi Ohtake and Kouhei Ohtani and Hideo Fujiwara",
booktitle = "{Proceedings of the Eighth Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.2003.10019",
isbn = "0-7695-1870-2",
pages = "10310--10315",
publisher = "{IEEE Computer Society}",
title = "{A Method of Test Generation fo Path Delay Faults Using Stuck-at Fault Test Generation Algorithms}",
year = 2003,
}