Irith Pomeranz, Sudhakar M. Reddy
A New Approach to Test Generation and Test Compaction for Scan Circuits
DATE, 2003.
@inproceedings{DATE-2003-PomeranzR,
acmid = "1022853",
author = "Irith Pomeranz and Sudhakar M. Reddy",
booktitle = "{Proceedings of the Eighth Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.2003.10002",
isbn = "0-7695-1870-2",
pages = "11000--11005",
publisher = "{IEEE Computer Society}",
title = "{A New Approach to Test Generation and Test Compaction for Scan Circuits}",
year = 2003,
}