Marcelino B. Santos, José M. Fernandes, Isabel C. Teixeira, João Paulo Teixeira
RTL Test Pattern Generation for High Quality Loosely Deterministic BIST
DATE, 2003.
@inproceedings{DATE-2003-SantosFTT,
acmid = "1022852",
author = "Marcelino B. Santos and José M. Fernandes and Isabel C. Teixeira and João Paulo Teixeira",
booktitle = "{Proceedings of the Eighth Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.2003.10010",
isbn = "0-7695-1870-2",
pages = "10994--10999",
publisher = "{IEEE Computer Society}",
title = "{RTL Test Pattern Generation for High Quality Loosely Deterministic BIST}",
year = 2003,
}