Travelled to:1 × Portugal
3 × Germany
Collaborated with:J.P.Teixeira M.B.Santos J.M.Fernandes J.C.Vázquez V.H.Champac H.Lérias J.Luz P.Moura A.Mendes Y.Zorian P.Prinetto C.E.Pereira O.P.Dias J.Semião P.Muhmenthaler W.Radermacher
Talks about:embed (2) test (2) determinist (1) programm (1) qualiti (1) pattern (1) generat (1) automot (1) acceler (1) tutori (1)
Person: Isabel C. Teixeira
DBLP: Teixeira:Isabel_C=
Contributed to:
201020032001
2001Wrote 4 papers:
- DATE-2010-VazquezCTST #programmable #safety
- Programmable aging sensor for automotive safety-critical applications (JCV, VHC, ICT, MBS, JPT), pp. 618–621.
- DATE-2003-SantosFTT #generative #quality
- RTL Test Pattern Generation for High Quality Loosely Deterministic BIST (MBS, JMF, ICT, JPT), pp. 10994–10999.
- DATE-2001-ZorianPTTPDSMR #embedded #tutorial
- Embedded tutorial: TRP: integrating embedded test and ATE (YZ, PP, JPT, ICT, CEP, OPD, JS, PM, WR), pp. 34–37.
- ICEIS-v2-2001-LeriasLMMTT #towards
- Towards E-Management as Enabler for Accelerated Change (HL, JL, PM, AM, ICT, JPT), pp. 807–814.