Rabeb Kheriji, V. Danelon, Jean-Louis Carbonéro, Salvador Mir
Optimising Test Sets for a Low Noise Amplifier with a Defect-Oriented Approach
DATE, 2005.
@inproceedings{DATE-2005-KherijiDCM, author = "Rabeb Kheriji and V. Danelon and Jean-Louis Carbonéro and Salvador Mir", booktitle = "{Proceedings of the Ninth Conference on Design, Automation and Test in Europe}", doi = "10.1109/DATE.2005.233", isbn = "0-7695-2288-2", pages = "170--171", publisher = "{IEEE Computer Society}", title = "{Optimising Test Sets for a Low Noise Amplifier with a Defect-Oriented Approach}", year = 2005, }