Rabeb Kheriji, V. Danelon, Jean-Louis Carbonéro, Salvador Mir
Optimising Test Sets for a Low Noise Amplifier with a Defect-Oriented Approach
DATE, 2005.
@inproceedings{DATE-2005-KherijiDCM,
author = "Rabeb Kheriji and V. Danelon and Jean-Louis Carbonéro and Salvador Mir",
booktitle = "{Proceedings of the Ninth Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.2005.233",
isbn = "0-7695-2288-2",
pages = "170--171",
publisher = "{IEEE Computer Society}",
title = "{Optimising Test Sets for a Low Noise Amplifier with a Defect-Oriented Approach}",
year = 2005,
}











