Optimising Test Sets for a Low Noise Amplifier with a Defect-Oriented Approach
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Rabeb Kheriji, V. Danelon, Jean-Louis Carbonéro, Salvador Mir
Optimising Test Sets for a Low Noise Amplifier with a Defect-Oriented Approach
DATE, 2005.

DATE 2005
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@inproceedings{DATE-2005-KherijiDCM,
	author        = "Rabeb Kheriji and V. Danelon and Jean-Louis Carbonéro and Salvador Mir",
	booktitle     = "{Proceedings of the Ninth Conference on Design, Automation and Test in Europe}",
	doi           = "10.1109/DATE.2005.233",
	isbn          = "0-7695-2288-2",
	pages         = "170--171",
	publisher     = "{IEEE Computer Society}",
	title         = "{Optimising Test Sets for a Low Noise Amplifier with a Defect-Oriented Approach}",
	year          = 2005,
}

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