Irith Pomeranz, Sudhakar M. Reddy
Worst-Case and Average-Case Analysis of n-Detection Test Sets
DATE, 2005.
@inproceedings{DATE-2005-PomeranzR,
author = "Irith Pomeranz and Sudhakar M. Reddy",
booktitle = "{Proceedings of the Ninth Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.2005.330",
isbn = "0-7695-2288-2",
pages = "444--449",
publisher = "{IEEE Computer Society}",
title = "{Worst-Case and Average-Case Analysis of n-Detection Test Sets}",
year = 2005,
}











