Evaluation of design for reliability techniques in embedded flash memories
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Benoît Godard, Jean Michel Daga, Lionel Torres, Gilles Sassatelli
Evaluation of design for reliability techniques in embedded flash memories
DATE, 2007.

DATE 2007
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@inproceedings{DATE-2007-GodardDTS,
	author        = "Benoît Godard and Jean Michel Daga and Lionel Torres and Gilles Sassatelli",
	booktitle     = "{Proceedings of the 11th Conference on Design, Automation and Test in Europe}",
	doi           = "10.1145/1266366.1266716",
	isbn          = "978-3-9810801-2-4",
	pages         = "1593--1598",
	publisher     = "{ACM}",
	title         = "{Evaluation of design for reliability techniques in embedded flash memories}",
	year          = 2007,
}

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