Travelled to:3 × France
Collaborated with:D.Auvergne E.Ottaviano B.Godard L.Torres G.Sassatelli S.Turgis J.M.Portal
Talks about:temperatur (1) techniqu (1) reliabl (1) voltag (1) memori (1) invert (1) intern (1) effect (1) design (1) applic (1)
Person: Jean Michel Daga
DBLP: Daga:Jean_Michel
Contributed to:
200719981997Wrote 3 papers:
- DATE-2007-GodardDTS #design #embedded #evaluation #reliability
- Evaluation of design for reliability techniques in embedded flash memories (BG, JMD, LT, GS), pp. 1593–1598.
- DATE-1998-DagaOA
- Temperature Effect on Delay for Low Voltage Applications (JMD, EO, DA), pp. 680–685.
- EDTC-1997-TurgisDPA #modelling
- Internal power modelling and minimization in CMOS inverters (ST, JMD, JMP, DA), pp. 603–608.