José Luis Rosselló, Carol de Benito, Sebastiàn A. Bota, Jaume Segura
Dynamic critical resistance: a timing-based critical resistance model for statistical delay testing of nanometer ICs
DATE, 2007.
@inproceedings{DATE-2007-RosselloBBS,
author = "José Luis Rosselló and Carol de Benito and Sebastiàn A. Bota and Jaume Segura",
booktitle = "{Proceedings of the 11th Conference on Design, Automation and Test in Europe}",
doi = "10.1145/1266366.1266645",
isbn = "978-3-9810801-2-4",
pages = "1271--1276",
publisher = "{ACM}",
title = "{Dynamic critical resistance: a timing-based critical resistance model for statistical delay testing of nanometer ICs}",
year = 2007,
}