Travelled to:2 × France
2 × Germany
Collaborated with:J.Segura S.A.Bota C.d.Benito M.Rosales V.Canals A.Keshavarzi
Talks about:model (4) delay (3) crosstalk (2) thermal (2) compact (2) resist (2) critic (2) test (2) base (2) temperatur (1)
Person: José Luis Rosselló
DBLP: Rossell=oacute=:Jos=eacute=_Luis
Contributed to:
2007200620052004Wrote 5 papers:
- DATE-2007-RosselloBBS #statistics #testing
- Dynamic critical resistance: a timing-based critical resistance model for statistical delay testing of nanometer ICs (JLR, CdB, SAB, JS), pp. 1271–1276.
- DATE-2006-RosselloS #fault #identification
- A compact model to identify delay faults due to crosstalk (JLR, JS), pp. 902–906.
- DATE-2005-BotaRRS #testing
- Smart Temperature Sensor for Thermal Testing of Cell-Based ICs (SAB, MR, JLR, JS), pp. 464–465.
- DATE-2005-RosselloCBKS #concurrent #performance
- A Fast Concurrent Power-Thermal Model for Sub-100nm Digital ICs (JLR, VC, SAB, AK, JS), pp. 206–211.
- DATE-v2-2004-RosselloS
- A Compact Propagation Delay Model for Deep-Submicron CMOS Gates including Crosstalk (JLR, JS), pp. 954–961.