Low-Noise Sigma-Delta Capacitance-to-Digital Converter for Sub-pF Capacitive Sensors with Integrated Dielectric Loss Measurement
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Markus Bingesser, Teddy Loeliger, Werner Hinn, Johann Hauer, Stefan Modl, Robert Dorn, Matthias Völker
Low-Noise Sigma-Delta Capacitance-to-Digital Converter for Sub-pF Capacitive Sensors with Integrated Dielectric Loss Measurement
DATE, 2008.

DATE 2008
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@inproceedings{DATE-2008-BingesserLHHMDV,
	author        = "Markus Bingesser and Teddy Loeliger and Werner Hinn and Johann Hauer and Stefan Modl and Robert Dorn and Matthias Völker",
	booktitle     = "{Proceedings of the 12th Conference on Design, Automation and Test in Europe}",
	doi           = "10.1109/DATE.2008.4484783",
	isbn          = "978-3-9810801-3-1",
	pages         = "868--872",
	publisher     = "{IEEE}",
	title         = "{Low-Noise Sigma-Delta Capacitance-to-Digital Converter for Sub-pF Capacitive Sensors with Integrated Dielectric Loss Measurement}",
	year          = 2008,
}

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