Travelled to:
1 × Germany
Collaborated with:
M.Bingesser T.Loeliger W.Hinn S.Modl R.Dorn M.Völker
Talks about:
capacit (2) dielectr (1) convert (1) sensor (1) measur (1) integr (1) sigma (1) digit (1) delta (1) nois (1)
Person: Johann Hauer
DBLP: Hauer:Johann
Contributed to:
Wrote 1 papers:
- DATE-2008-BingesserLHHMDV #metric
- Low-Noise Sigma-Delta Capacitance-to-Digital Converter for Sub-pF Capacitive Sensors with Integrated Dielectric Loss Measurement (MB, TL, WH, JH, SM, RD, MV), pp. 868–872.