Yanjing Li, Samy Makar, Subhasish Mitra
CASP: Concurrent Autonomous Chip Self-Test Using Stored Test Patterns
DATE, 2008.
@inproceedings{DATE-2008-LiMM, author = "Yanjing Li and Samy Makar and Subhasish Mitra", booktitle = "{Proceedings of the 12th Conference on Design, Automation and Test in Europe}", doi = "10.1109/DATE.2008.4484786", isbn = "978-3-9810801-3-1", pages = "885--890", publisher = "{IEEE}", title = "{CASP: Concurrent Autonomous Chip Self-Test Using Stored Test Patterns}", year = 2008, }