Bao Liu
Spatial Correlation Extraction via Random Field Simulation and Production Chip Performance Regression
DATE, 2008.
@inproceedings{DATE-2008-Liu08a, author = "Bao Liu", booktitle = "{Proceedings of the 12th Conference on Design, Automation and Test in Europe}", doi = "10.1109/DATE.2008.4484904", isbn = "978-3-9810801-3-1", pages = "527--532", publisher = "{IEEE}", title = "{Spatial Correlation Extraction via Random Field Simulation and Production Chip Performance Regression}", year = 2008, }