Subhasish Mitra
Globally Optimized Robust Systems to Overcome Scaled CMOS Reliability Challenges
DATE, 2008.
@inproceedings{DATE-2008-Mitra,
author = "Subhasish Mitra",
booktitle = "{Proceedings of the 12th Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.2008.4484801",
isbn = "978-3-9810801-3-1",
pages = "941--946",
publisher = "{IEEE}",
title = "{Globally Optimized Robust Systems to Overcome Scaled CMOS Reliability Challenges}",
year = 2008,
}