Mingjing Chen, Alex Orailoglu
Cost-effective IR-drop failure identification and yield recovery through a failure-adaptive test scheme
DATE, 2010.
@inproceedings{DATE-2010-ChenO, author = "Mingjing Chen and Alex Orailoglu", booktitle = "{Proceedings of the 14th Conference on Design, Automation and Test in Europe}", pages = "63--68", publisher = "{IEEE}", title = "{Cost-effective IR-drop failure identification and yield recovery through a failure-adaptive test scheme}", year = 2010, }