A. J. van de Goor, Georgi Gaydadjiev, Said Hamdioui
Memory testing with a RISC microcontroller
DATE, 2010.
@inproceedings{DATE-2010-GoorGH,
author = "A. J. van de Goor and Georgi Gaydadjiev and Said Hamdioui",
booktitle = "{Proceedings of the 14th Conference on Design, Automation and Test in Europe}",
pages = "214--219",
publisher = "{IEEE}",
title = "{Memory testing with a RISC microcontroller}",
year = 2010,
}











