Memory testing with a RISC microcontroller
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A. J. van de Goor, Georgi Gaydadjiev, Said Hamdioui
Memory testing with a RISC microcontroller
DATE, 2010.

DATE 2010
Full names Links ISxN
	author        = "A. J. van de Goor and Georgi Gaydadjiev and Said Hamdioui",
	booktitle     = "{Proceedings of the 14th Conference on Design, Automation and Test in Europe}",
	pages         = "214--219",
	publisher     = "{IEEE}",
	title         = "{Memory testing with a RISC microcontroller}",
	year          = 2010,


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