Qi Guo, Tianshi Chen, Haihua Shen, Yunji Chen, Yue Wu, Weiwu Hu
Empirical design bugs prediction for verification
DATE, 2011.
@inproceedings{DATE-2011-GuoCSCWH,
author = "Qi Guo and Tianshi Chen and Haihua Shen and Yunji Chen and Yue Wu and Weiwu Hu",
booktitle = "{Proceedings of the 15th Conference on Design, Automation and Test in Europe}",
isbn = "978-1-61284-208-0",
pages = "161--166",
publisher = "{IEEE}",
title = "{Empirical design bugs prediction for verification}",
year = 2011,
}