@inproceedings{DATE-2013-GaoBW,
	acmid         = "2485703",
	author        = "Yue Gao and Melvin A. Breuer and Yanzhi Wang",
	booktitle     = "{Proceedings of the 17th Conference on Design, Automation and Test in Europe}",
	isbn          = "978-1-4503-2153-2",
	pages         = "1753--1758",
	publisher     = "{EDA Consortium San Jose, CA, USA / ACM DL}",
	title         = "{A new paradigm for trading off yield, area and performance to enhance performance per wafer}",
	year          = 2013,
}