Handling discontinuous effects in modeling spatial correlation of wafer-level analog/RF tests
BibSLEIGH corpus
BibSLEIGH tags
BibSLEIGH bundles
BibSLEIGH people
EDIT!
CC-BY
Open Knowledge
XHTML 1.0 W3C Rec
CSS 2.1 W3C CanRec
email twitter

Ke Huang, Nathan Kupp, John M. Carulli Jr., Yiorgos Makris
Handling discontinuous effects in modeling spatial correlation of wafer-level analog/RF tests
DATE, 2013.

DATE 2013
DBLP
Scholar
Full names Links ISxN
@inproceedings{DATE-2013-HuangKCM,
	acmid         = "2485425",
	author        = "Ke Huang and Nathan Kupp and John M. Carulli Jr. and Yiorgos Makris",
	booktitle     = "{Proceedings of the 17th Conference on Design, Automation and Test in Europe}",
	isbn          = "978-1-4503-2153-2",
	pages         = "553--558",
	publisher     = "{EDA Consortium San Jose, CA, USA / ACM DL}",
	title         = "{Handling discontinuous effects in modeling spatial correlation of wafer-level analog/RF tests}",
	year          = 2013,
}

Tags:



Bibliography of Software Language Engineering in Generated Hypertext (BibSLEIGH) is created and maintained by Dr. Vadim Zaytsev.
Hosted as a part of SLEBOK on GitHub.