Travelled to:1 × Germany
2 × France
Collaborated with:K.M.Butler K.Huang N.Kupp Y.Makris H.R.Gonçalves X.Li M.V.Correia V.Tavares E.J.Marinissen A.Singh D.Glotter M.Esposito A.Nahar D.Appello C.Portelli
Talks about:test (3) spatial (2) analog (2) model (2) adapt (2) discontinu (1) algorithm (1) circuit (1) variat (1) reduct (1)
Person: John M. Carulli Jr.
DBLP: Carulli Jr.:John_M=
Contributed to:
201520132010Wrote 3 papers:
- DATE-2015-GoncalvesLCTCB #algorithm #modelling #performance #reduction
- A fast spatial variation modeling algorithm for efficient test cost reduction of analog/RF circuits (HRG, XL, MVC, VT, JMCJ, KMB), pp. 1042–1047.
- DATE-2013-HuangKCM #correlation #modelling #testing
- Handling discontinuous effects in modeling spatial correlation of wafer-level analog/RF tests (KH, NK, JMCJ, YM), pp. 553–558.
- DATE-2010-MarinissenSGECNBAP #adaptation #testing
- Adapting to adaptive testing (EJM, AS, DG, ME, JMCJ, AN, KMB, DA, CP), pp. 556–561.