Caio Hoffman, Luiz Ramos, Rodolfo Azevedo, Guido Araujo
Wear-out analysis of Error Correction Techniques in Phase-Change Memory
DATE, 2014.
@inproceedings{DATE-2014-HoffmanRAA,
author = "Caio Hoffman and Luiz Ramos and Rodolfo Azevedo and Guido Araujo",
booktitle = "{Proceedings of the 18th Conference and Exhibition on Design, Automation and Test in Europe}",
doi = "10.7873/DATE.2014.047",
pages = "1--4",
publisher = "{IEEE}",
title = "{Wear-out analysis of Error Correction Techniques in Phase-Change Memory}",
year = 2014,
}