Travelled to:
1 × Germany
Collaborated with:
C.Hoffman R.Azevedo G.Araujo
Talks about:
techniqu (1) correct (1) analysi (1) memori (1) phase (1) error (1) chang (1) wear (1) out (1)
Person: Luiz Ramos
DBLP: Ramos:Luiz
Contributed to:
Wrote 1 papers:
- DATE-2014-HoffmanRAA #analysis #fault #memory management
- Wear-out analysis of Error Correction Techniques in Phase-Change Memory (CH, LR, RA, GA), pp. 1–4.