An effective approach to automatic functional processor test generation for small-delay faults
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Andreas Riefert, Lyl M. Ciganda, Matthias Sauer, Paolo Bernardi, Matteo Sonza Reorda, Bernd Becker
An effective approach to automatic functional processor test generation for small-delay faults
DATE, 2014.

DATE 2014
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@inproceedings{DATE-2014-RiefertCSBRB,
	author        = "Andreas Riefert and Lyl M. Ciganda and Matthias Sauer and Paolo Bernardi and Matteo Sonza Reorda and Bernd Becker",
	booktitle     = "{Proceedings of the 18th Conference and Exhibition on Design, Automation and Test in Europe}",
	doi           = "10.7873/DATE.2014.140",
	pages         = "1--6",
	publisher     = "{IEEE}",
	title         = "{An effective approach to automatic functional processor test generation for small-delay faults}",
	year          = 2014,
}

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