Travelled to:4 × France
5 × Germany
Collaborated with:M.S.Reorda E.Sánchez O.Ballan M.Rebaudengo M.Violante M.Grosso G.Masera F.Quaglio M.Bonazza M.Schillaci G.Squillero A.Riefert L.M.Ciganda M.Sauer B.Becker A.Touati A.Bosio L.Dilillo P.Girard A.Virazel M.Bellato D.Bortolato A.Candelori M.Ceschia A.Paccagnella P.Zambolin
Talks about:test (7) base (4) processor (3) function (3) approach (3) effect (3) fault (3) softwar (2) memori (2) embed (2)
Person: Paolo Bernardi
DBLP: Bernardi:Paolo
Contributed to:
201520142013201120082006200420042003Wrote 9 papers:
- DATE-2015-TouatiBDGVBR #functional #power management #source code #testing
- Exploring the impact of functional test programs re-used for power-aware testing (AT, AB, LD, PG, AV, PB, MSR), pp. 1277–1280.
- DATE-2014-RiefertCSBRB #approach #automation #effectiveness #fault #functional #generative #testing
- An effective approach to automatic functional processor test generation for small-delay faults (AR, LMC, MS, PB, MSR, BB), pp. 1–6.
- DATE-2013-BernardiBSRB #embedded #fault #identification #online
- On-line functionally untestable fault identification in embedded processor cores (PB, MB, ES, MSR, OB), pp. 1462–1467.
- DATE-2011-BernardiGSB #fault #self #testing
- Fault grading of software-based self-test procedures for dependable automotive applications (PB, MG, ES, OB), pp. 513–514.
- DATE-2008-BernardiR #novel #testing
- An novel Methodology for Reducing SoC Test Data Volume on FPGA-based Testers (PB, MSR), pp. 194–199.
- DATE-2006-BernardiSSSR #cost analysis #effectiveness
- An effective technique for minimizing the cost of processor software-based diagnosis in SoCs (PB, ES, MS, GS, MSR), pp. 412–417.
- DATE-2005-BernardiMQR04 #approach #logic #testing #using
- Testing Logic Cores using a BIST P1500 Compliant Approach: A Case of Study (PB, GM, FQ, MSR), pp. 228–233.
- DATE-v1-2004-BellatoBBCCPRRVZ #memory management
- Evaluating the Effects of SEUs Affecting the Configuration Memory of an SRAM-Based FPGA (MB, PB, DB, AC, MC, AP, MR, MSR, MV, PZ), pp. 584–589.
- DATE-2003-BernardiRRV #approach #embedded #programmable
- A P1500-Compatible Programmable BIST Approach for the Test of Embedded Flash Memories (PB, MR, MSR, MV), pp. 10720–10725.