Hugo R. Gonçalves, Xin Li, Miguel V. Correia, Vitor Tavares, John M. Carulli Jr., Kenneth M. Butler
A fast spatial variation modeling algorithm for efficient test cost reduction of analog/RF circuits
DATE, 2015.
@inproceedings{DATE-2015-GoncalvesLCTCB,
acmid = "2757055",
author = "Hugo R. Gonçalves and Xin Li and Miguel V. Correia and Vitor Tavares and John M. Carulli Jr. and Kenneth M. Butler",
booktitle = "{Proceedings of the 19th Conference and Exhibition on Design, Automation and Test in Europe}",
isbn = "978-3-9815370-4-8",
pages = "1042--1047",
publisher = "{ACM}",
title = "{A fast spatial variation modeling algorithm for efficient test cost reduction of analog/RF circuits}",
year = 2015,
}