Travelled to:1 × France
1 × Germany
4 × USA
Collaborated with:M.R.Mercer D.E.Ross J.M.C.Jr. J.A.Kumar H.Kim S.Vasudevan R.Kapur R.K.Gaede H.R.Gonçalves X.Li M.V.Correia V.Tavares E.J.Marinissen A.Singh D.Glotter M.Esposito A.Nahar D.Appello C.Portelli
Talks about:test (4) topolog (2) effici (2) order (2) model (2) fault (2) adapt (2) use (2) algorithm (1) parallel (1)
Person: Kenneth M. Butler
DBLP: Butler:Kenneth_M=
Contributed to:
2015
20122010199119901988Wrote 6 papers:
- DATE-2015-GoncalvesLCTCB #algorithm #modelling #performance #reduction
- A fast spatial variation modeling algorithm for efficient test cost reduction of analog/RF circuits (HRG, XL, MVC, VT, JMCJ, KMB), pp. 1042–1047.
- DAC-2012-KumarBKV #analysis #predict #source code #using
- Early prediction of NBTI effects using RTL source code analysis (JAK, KMB, HK, SV), pp. 808–813.
- DATE-2010-MarinissenSGECNBAP #adaptation #testing
- Adapting to adaptive testing (EJM, AS, DG, ME, JMCJ, AN, KMB, DA, CP), pp. 556–561.
- DAC-1991-ButlerRKM #diagrams #heuristic #order #performance
- Heuristics to Compute Variable Orderings for Efficient Manipulation of Ordered Binary Decision Diagrams (KMB, DER, RK, MRM), pp. 417–420.
- DAC-1990-ButlerM #design #fault #performance
- The Influences of Fault Type and Topology on Fault Model Performance and the Implications to Test and Testable Design (KMB, MRM), pp. 673–678.
- DAC-1988-GaedeRMB #automation #concurrent #named #parallel #testing #using
- CATAPULT: Concurrent Automatic Testing Allowing Parallelization and Using Limited Topology (RKG, DER, MRM, KMB), pp. 597–600.