DP-fill: a dynamic programming approach to X-filling for minimizing peak test power in scan tests
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Satya Trinadh, Ch. Sobhan Babu, Shiv Govind Singh, Seetal Potluri, V. Kamakoti
DP-fill: a dynamic programming approach to X-filling for minimizing peak test power in scan tests
DATE, 2015.

DATE 2015
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@inproceedings{DATE-2015-TrinadhBSPK,
	acmid         = "2755943",
	author        = "Satya Trinadh and Ch. Sobhan Babu and Shiv Govind Singh and Seetal Potluri and V. Kamakoti",
	booktitle     = "{Proceedings of the 19th Conference and Exhibition on Design, Automation and Test in Europe}",
	isbn          = "978-3-9815370-4-8",
	pages         = "836--841",
	publisher     = "{ACM}",
	title         = "{DP-fill: a dynamic programming approach to X-filling for minimizing peak test power in scan tests}",
	year          = 2015,
}

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