Satya Trinadh, Ch. Sobhan Babu, Shiv Govind Singh, Seetal Potluri, V. Kamakoti
DP-fill: a dynamic programming approach to X-filling for minimizing peak test power in scan tests
DATE, 2015.
@inproceedings{DATE-2015-TrinadhBSPK, acmid = "2755943", author = "Satya Trinadh and Ch. Sobhan Babu and Shiv Govind Singh and Seetal Potluri and V. Kamakoti", booktitle = "{Proceedings of the 19th Conference and Exhibition on Design, Automation and Test in Europe}", isbn = "978-3-9815370-4-8", pages = "836--841", publisher = "{ACM}", title = "{DP-fill: a dynamic programming approach to X-filling for minimizing peak test power in scan tests}", year = 2015, }