Travelled to:1 × France
Collaborated with:S.Trinadh S.G.Singh S.Potluri V.Kamakoti
Talks about:test (2) fill (2) approach (1) program (1) power (1) minim (1) dynam (1) scan (1) peak (1)
Person: Ch. Sobhan Babu
DBLP: Babu:Ch=_Sobhan
Contributed to:
2015Wrote 1 papers:
- DATE-2015-TrinadhBSPK #approach #named #programming #testing
- DP-fill: a dynamic programming approach to X-filling for minimizing peak test power in scan tests (ST, CSB, SGS, SP, VK), pp. 836–841.