Symbolic QED Pre-silicon Verification for Automotive Microcontroller Cores: Industrial Case Study
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Eshan Singh, Keerthikumara Devarajegowda, Sebastian Simon, Ralf Schnieder, Karthik Ganesan, Mohammad Rahmani Fadiheh, Dominik Stoffel, Wolfgang Kunz, Clark W. Barrett, Wolfgang Ecker, Subhasish Mitra
Symbolic QED Pre-silicon Verification for Automotive Microcontroller Cores: Industrial Case Study
DATE, 2019.

DATE 2019
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@inproceedings{DATE-2019-SinghDSSGFSKBEM,
	author        = "Eshan Singh and Keerthikumara Devarajegowda and Sebastian Simon and Ralf Schnieder and Karthik Ganesan and Mohammad Rahmani Fadiheh and Dominik Stoffel and Wolfgang Kunz and Clark W. Barrett and Wolfgang Ecker and Subhasish Mitra",
	booktitle     = "{Proceedings of the 23rd Conference and Exhibition on Design, Automation and Test in Europe}",
	doi           = "10.23919/DATE.2019.8715271",
	isbn          = "978-3-9819263-2-3",
	pages         = "1000--1005",
	publisher     = "{IEEE}",
	title         = "{Symbolic QED Pre-silicon Verification for Automotive Microcontroller Cores: Industrial Case Study}",
	year          = 2019,
}


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