SoC Test Scheduling with Power-Time Tradeoff and Hot Spot Avoidance
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James Chin, Mehrdad Nourani
SoC Test Scheduling with Power-Time Tradeoff and Hot Spot Avoidance
DATE, 2004.

DATE v1 2004
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@inproceedings{DATE-v1-2004-ChinN,
	author        = "James Chin and Mehrdad Nourani",
	booktitle     = "{Proceedings of the Eighth Conference on Design, Automation and Test in Europe, Volume 1}",
	doi           = "10.1109/DATE.2004.1268942",
	isbn          = "0-7695-2085-5",
	pages         = "710--711",
	publisher     = "{IEEE Computer Society}",
	title         = "{SoC Test Scheduling with Power-Time Tradeoff and Hot Spot Avoidance}",
	year          = 2004,
}

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