Zaid Al-Ars, A. J. van de Goor
Soft Faults and the Importance of Stresses in Memory Testing
DATE, 2004.
@inproceedings{DATE-v2-2004-Al-ArsG,
author = "Zaid Al-Ars and A. J. van de Goor",
booktitle = "{Proceedings of the Eighth Conference on Design, Automation and Test in Europe, Volume 2}",
doi = "10.1109/DATE.2004.1269037",
isbn = "0-7695-2085-5",
pages = "1084--1091",
publisher = "{IEEE Computer Society}",
title = "{Soft Faults and the Importance of Stresses in Memory Testing}",
year = 2004,
}