Baris Arslan, Alex Orailoglu
CircularScan: A Scan Architecture for Test Cost Reduction
DATE, 2004.
@inproceedings{DATE-v2-2004-ArslanO,
author = "Baris Arslan and Alex Orailoglu",
booktitle = "{Proceedings of the Eighth Conference on Design, Automation and Test in Europe, Volume 2}",
doi = "10.1109/DATE.2004.1269073",
isbn = "0-7695-2085-5",
pages = "1290--1295",
publisher = "{IEEE Computer Society}",
title = "{CircularScan: A Scan Architecture for Test Cost Reduction}",
year = 2004,
}