CircularScan: A Scan Architecture for Test Cost Reduction
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Baris Arslan, Alex Orailoglu
CircularScan: A Scan Architecture for Test Cost Reduction
DATE, 2004.

DATE v2 2004
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@inproceedings{DATE-v2-2004-ArslanO,
	author        = "Baris Arslan and Alex Orailoglu",
	booktitle     = "{Proceedings of the Eighth Conference on Design, Automation and Test in Europe, Volume 2}",
	doi           = "10.1109/DATE.2004.1269073",
	isbn          = "0-7695-2085-5",
	pages         = "1290--1295",
	publisher     = "{IEEE Computer Society}",
	title         = "{CircularScan: A Scan Architecture for Test Cost Reduction}",
	year          = 2004,
}

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