Janusz Rajski, Kan Thapar
Nanometer Design: What are the Requirements for Manufacturing Test?
DATE, 2004.
@inproceedings{DATE-v2-2004-RajskiT,
	author        = "Janusz Rajski and Kan Thapar",
	booktitle     = "{Proceedings of the Eighth Conference on Design, Automation and Test in Europe, Volume 2}",
	doi           = "10.1109/DATE.2004.1269010",
	isbn          = "0-7695-2085-5",
	pages         = "930--937",
	publisher     = "{IEEE Computer Society}",
	title         = "{Nanometer Design: What are the Requirements for Manufacturing Test?}",
	year          = 2004,
}











