Sen-Pin Lin, Sandeep K. Gupta, Melvin A. Breuer
A Low Cost BIST Methodology and Associated Novel Test Pattern Generator
DATE, 1994.
@inproceedings{EDAC-1994-LinGB,
author = "Sen-Pin Lin and Sandeep K. Gupta and Melvin A. Breuer",
booktitle = "{Proceedings of the European Conference on Design Automation (EDAC), European Test Conference (ETC) and the European Event in ASIC Design (EUROASIC)}",
isbn = "0-8186-5410-4",
pages = "106--112",
publisher = "{IEEE Computer Society}",
title = "{A Low Cost BIST Methodology and Associated Novel Test Pattern Generator}",
year = 1994,
}