Travelled to:
1 × France
Collaborated with:
S.K.Gupta M.A.Breuer
Talks about:
methodolog (1) pattern (1) generat (1) associ (1) novel (1) test (1) cost (1) bist (1) low (1)
Person: Sen-Pin Lin
DBLP: Lin:Sen=Pin
Contributed to:
Wrote 1 papers:
- EDAC-1994-LinGB #generative #low cost #novel
- A Low Cost BIST Methodology and Associated Novel Test Pattern Generator (SPL, SKG, MAB), pp. 106–112.