Chauchin Su
Random Testing of Interconnects in A Boundary Scan Environment
DATE, 1994.
@inproceedings{EDAC-1994-Su,
author = "Chauchin Su",
booktitle = "{Proceedings of the European Conference on Design Automation (EDAC), European Test Conference (ETC) and the European Event in ASIC Design (EUROASIC)}",
isbn = "0-8186-5410-4",
pages = "226--231",
publisher = "{IEEE Computer Society}",
title = "{Random Testing of Interconnects in A Boundary Scan Environment}",
year = 1994,
}