Subhrajit Bhattacharya, Sujit Dey, Bhaskar Sengupta
An RTL methodology to enable low overhead combinational testing
DATE, 1997.
@inproceedings{EDTC-1997-BhattacharyaDS, author = "Subhrajit Bhattacharya and Sujit Dey and Bhaskar Sengupta", booktitle = "{Proceedings of the Second European Design and Test Conference}", doi = "10.1109/EDTC.1997.582349", pages = "146--152", publisher = "{IEEE}", title = "{An RTL methodology to enable low overhead combinational testing}", year = 1997, }